Control Method:Centralized / Computerized
System Structure:Modular
Fault Disconnection:≤10 ms
Test Scope:Full electrical inspection for power transformers
Control Solution:Intelligent automatic PC measurement & control
Safety Protection:3-level overload safeguard, 10ms rapid fault current breaking
Control Method:Computerized automatic measurement and control
Safety Performance:Triple overload protection, fault cut-off within 10ms
Main Components:Medium-frequency generator, induction voltage regulator, test transformer & cabinets
Testing Function:Complete electrical performance test for transformers
Operation:Intelligent PC automatic measurement & control
Main Modules:Medium-frequency generator set, induction regulator, test transformer, power cabinets
Control System:PC-based automatic measuring & controlling
Main Assemblies:Medium frequency generator, induction regulator, test transformer, control cabinet
Safety Design:Triple overload protection, 10ms rapid fault current interruption
Operation Mode:Intelligent automatic measurement & control
Safety Protection:Three-level overload protection, fast fault cut-off within 10ms
Built-in Test Instruments:Power analyzer, DC resistance tester, ratio tester
Control Method:Computerized Central Control
System Design:Modular & Integrated
Measurement Parameters:Voltage / Current / Electrical Parameters
Operation type:Computer automatic control
System components:Medium-frequency generator, induction regulator, test transformer, control cabinets
Safety protection:3-level overload protection, 10ms fault cut-off
Safety Feature:Built-in 3-stage overload protection, cut fault current within 10ms
Control Mode:Fully automatic computer measurement & control
System Composition:Medium frequency generator set, induction regulator, test transformer, cabinets
Testing functions:Customizable
Voltage levels:Adjustable
Measurement technology:Advanced
Testing functions:Customizable
Voltage levels:Adjustable
Measurement technology:Advanced
Testing process:Optimized
Testing functions:Customizable
Testing efficiency:Improved